BENCHTOP POWDER X-RAY DIFFRACTION (XRD) INSTRUMENT
Qualitative and quantitative phase analysis of poly-crystalline materials
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Benchtop X-ray diffractometer for phase analysis
New sixth generation MiniFlex benchtop X-ray diffractometer is a multipurpose powder diffraction analytical instrument that can determine: crystalline phase identification (phase ID) and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to the MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex XRD system decades ago.
X-ray powder diffraction with HPAD detector
MiniFlex XRD system delivers speed and sensitivity through innovative technology advances, including the HyPix-400 MF 2D hybrid pixel array detector (HPAD) together with an available 600 W X-ray source and new 8-position automatic sample changer.
Hybrid pixel array detector (HPAD)
This new direct photon counting detector enables high-speed, low-noise data collection and may be operated in 0D and 1D modes for conventional XRD analysis and 2D mode for samples with coarse grain size and/or preferred orientation.
XRD accessories enhance your MiniFlex
A variety of X-ray tube anodes – along with a range of sample rotation and positioning accessories, together with a variety of temperature attachments – are offered to ensure that the MiniFlex X-ray diffraction (XRD) system is versatile enough to perform challenging qualitative and quantitative analyses of a broad range of samples, whether performing research or routine quality control. The new (Gen 6) MiniFlex X-ray diffractometer system embodies the Rigaku philosophy of “Leading with Innovation” by offering the world’s most advanced benchtop system ...
Specifications
| Product name | MiniFlex |
| Technique | X-ray diffraction (XRD) |
| Benefit | Phase analysis of poly-crystalline materials |
| Technology | Benchtop X-ray diffractometer with advanced detector |
| Core attributes | 600 W X-ray tube, D/teX Ultra silicon strip detector, accepts unusual samples, tabletop form factor |
| Core options | 8-position autosampler, HyPix-400 MF (2D HPAD) detector, graphite monochromator, air sensitive sample holder,ShapeFlex sample holder |
| Computer | External PC, MS Windows® OS, SmartLab Studio-II software |
| Core dimensions | 620 (W) x 722 (H) x 460 (D) mm |
| Mass | 80 kg (core unit) |
| Power requirements | 1Ø, 100-240 V 50/60 Hz |